Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD

作者：Clément Ernould, Benoît Beausir, Jean‐Jacques Fundenberger, Vincent Taupin, Emmanuel Bouzy · 发表于：Scripta Materialia · 年份：2020 · DOI：10.1016/j.scriptamat.2020.04.005 · 被引用次数：32 · 研究领域：Microstructure and mechanical properties、Advanced Electron Microscopy Techniques and Applications、Aluminum Alloy Microstructure Properties