Comparison of 3D cellular imaging techniques based on scanned electron probes: Serial block face SEM vs. Axial bright-field STEM tomography

作者：E.L. McBride, A. R. Rao, G. Zhang, Jake D. Hoyne, Gina N. Calco, B.C. Kuo, Qun He, Andrew A. Prince, Irina D. Pokrovskaya, Brian Storrie, Alioscka A. Sousa, Maria A. Aronova, Richard D. Leapman · 发表于：Journal of Structural Biology · 年份：2018 · DOI：10.1016/j.jsb.2018.01.012 · 被引用次数：16 · 研究领域：Advanced Electron Microscopy Techniques and Applications、Electron and X-Ray Spectroscopy Techniques、Integrated Circuits and Semiconductor Failure Analysis