H- and heavy ion injection lines for the Booster

作者：R. C. Gupta, R. Damm, USDOE SC OFFICE OF SCIENCE (SC), Y. Lee, W. Weng · 年份：1987 · DOI：10.2172/1150471 · 被引用次数：2 · 研究领域：Plasma Diagnostics and Applications、Radiation Effects in Electronics、Ion-surface interactions and analysis

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