Numerical Analysis of Multi-Carrier Microwave Breakdown in Waveguide Components

作者：Cheng Qian, Dazhi Ding, Junjian Bi, Rushan Chen · 发表于：IEEE Microwave and Wireless Components Letters · 年份：2016 · DOI：10.1109/lmwc.2016.2517156 · 被引用次数：18 · 研究领域：Gyrotron and Vacuum Electronics Research、Microwave Engineering and Waveguides、Electromagnetic Simulation and Numerical Methods

In this letter, the multi-carrier microwave breakdown in a double-ridge waveguide is analyzed with the spectral-element time-domain (SETD) method. Both tail-erosion phenomena and bandwidth broadening caused by multi-carrier microwave breakdown can be observed in time and frequency domain, respectively. Numerical results demonstrate that the high peak to average power factor (PF) will make the wireless communication system to be sensitive to microwave breakdown and introduce nonlinear phenomena. The proposed method is an effective tool to provide an insight into the physics process.