Devices for high precision x-ray beam intensity monitoring on BSRF

作者：LI Hua-Peng, Kun Tang, Zhao Yi-Dong, Lei Zheng, Shuhu Liu, Xiaoliang Zhao, Yingfei Zhao · 发表于：arXiv (Cornell University) · 年份：2015 · DOI：10.48550/arxiv.1512.09197 · 研究领域：Advanced X-ray Imaging Techniques、X-ray Spectroscopy and Fluorescence Analysis、Particle Accelerators and Free-Electron Lasers

Synchrotron radiation with the characteristic of high brilliance, high level of polarization, high collimation, low emittance and wide tunability in energy has been used as a standard source in metrology(1, 2). For a decade, lots of calibration work have been done on 4B7A in Beijing Synchrotron Radiation Facility (BSRF) (3, 4). For the calibration process, a high-precision online monitor is indispensable. To control the uncertainty under 0.1%, we studied different sizes parallel ion chambers with rare-gas and used different collecting methods to monitor the x-ray intensity of the beamline. Two methods to collect the signal of the ion chambers: reading the current directly with electrometer or signal amplification to collect the counts were compared.