R factors in Rietveld analysis: How good is good enough?

作者：Brian H. Toby · 发表于：Powder Diffraction · 年份：2006 · DOI：10.1154/1.2179804 · 被引用次数：1490 · 研究领域：X-ray Diffraction in Crystallography、Machine Learning in Materials Science、Geochemistry and Geochronology of Asian Mineral Deposits

The definitions for important Rietveld error indices are defined and discussed. It is shown that while smaller error index values indicate a better fit of a model to the data, wrong models with poor quality data may exhibit smaller values error index values than some superb models with very high quality data.