Observing the varying scanning tunneling microscopy image of graphite

作者：J. E. Yao, Yangbohan Jiao · 发表于：Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 年份：1990 · DOI：10.1116/1.576376 · 被引用次数：6 · 研究领域：Surface and Thin Film Phenomena、Graphene research and applications、Force Microscopy Techniques and Applications

Varying image of graphite was observed occasionally using a mechanically sharpened tip of Pt–Ir wire on the same sample area without any changing in bias voltage, tunneling current, scan rate. It is interesting that two images formed while the tip scanned in one frame and retraced in other frame were different. It is estimated that the end of the tip changed and the functioning part of the tip was not the same as the tip scanned and retraced.