Autonomic Restoration of Electrical Conductivity

作者：Ben J. Blaiszik, Sharlotte Kramer, Martha E. Grady, David A. McIlroy, Jeffrey S. Moore, Nancy R. Sottos, Scott R. White · 发表于：Advanced Materials · 年份：2011 · DOI：10.1002/adma.201102888 · 被引用次数：321 · 研究领域：Advanced Memory and Neural Computing、Advanced Sensor and Energy Harvesting Materials、Neuroscience and Neural Engineering

Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium-indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).