Near-Field Microscopy Through a SiC Superlens

作者：Thomas Taubner, Dmitriy V. Korobkin, Yaroslav A. Urzhumov, Gennady B. Shvets, Rainer Hillenbrand · 发表于：Science · 年份：2006 · DOI：10.1126/science.1131025 · 被引用次数：599 · 研究领域：Near-Field Optical Microscopy、Photonic Crystals and Applications、Metamaterials and Metasurfaces Applications

The wave nature of light limits the spatial resolution in classical microscopy to about half of the illumination wavelength. Recently, a new approach capable of achieving subwavelength spatial resolution, called superlensing, was invented, challenging the already established method of scanning near-field optical microscopy (SNOM). We combine the advantages of both techniques and demonstrate a novel imaging system where the objects no longer need to be in close proximity to a near-field probe, allowing for optical near-field microscopy of subsurface objects at sub-wavelength-scale lateral resolution.