Tentative analysis of Swirl defects in silicon crystals

作者：T. W. Fan, J. J. Qian, Jun Wu, Laicun Lin, Jun Yuan · 发表于：Journal of Crystal Growth · 年份：2000 · DOI：10.1016/s0022-0248(00)00350-x · 被引用次数：16 · 研究领域：Silicon and Solar Cell Technologies、Thin-Film Transistor Technologies、Integrated Circuits and Semiconductor Failure Analysis