<title>Designing an apparatus for measuring bidirectional reflection/transmission</title>

作者：Peter Apian-Bennewitz · 发表于：Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 年份：1994 · DOI：10.1117/12.185410 · 被引用次数：17 · 研究领域：Sensor Technology and Measurement Systems、Calibration and Measurement Techniques、Advanced MEMS and NEMS Technologies

An apparatus for measuring angle-dependent transmission and reflection of large (40 cm X 40 cm) samples is presented and details of the optical, mechanical and computer aspects given. The apparatus consists of two fixed light sources, an adjustable sample holder and a movable solar cell as the detector. All angle positions are computer-controlled, using a workstation to achieve automatic measurements. Data-processing steps for large and small samples are presented.