Characterization of the Ageing of Plasma-deposited Polymer Films: Global Analysis of X-ray Photoelectron Spectroscopy Data

作者：Thomas R. Gengenbach, Ronald C. Chatelier, Hans J. Griesser · 发表于：Surface and Interface Analysis · 年份：1996 · DOI：10.1002/(sici)1096-9918(199604)24:4<271::aid-sia116>3.0.co;2-j · 被引用次数：164 · 研究领域：Electron and X-Ray Spectroscopy Techniques、Corrosion Behavior and Inhibition、Semiconductor materials and devices

A protocol for global analysis of x-ray photoelectron spectra of plasma-deposited polymer films is presented. These materials are difficult to analyse because of the multitude of different chemical groups present. The combination of different primary and secondary binding energy shifts results in relatively broad, featureless photoelectron peaks. The protocol is based on fitting a series of spectra obtained by monitoring the surface composition of a plasma polymer film over extended periods of time after deposition. Information obtained from this first round of curve-fitting is used in the form of additional constraints for a second round of fitting. This leads to a self-consistent procedure which is akin to a global approach to curve-fitting. To illustrate application of this method, results of a study of ann-heptylamine plasma polymer are described. The spectral changes on ageing provided clear evidence for radical-initiated oxidation reactions. These reactions generated additional radicals, which sustained the oxidation process for many months and not only led to substantial incorporation of oxygen into the material (forming a variety of carbon–oxygen functionalities) but also to conversion of most of the existing carbon–nitrogen functionalities to an oxidized form.