Calcium Phosphate Phase Identification Using XPS and Time-of-Flight Cluster SIMS

作者：Charles C. Chusuei, D. Wayne Goodman, Michael J. Van Stipdonk, Dina R. Justes, E. A. Schweikert · 发表于：Analytical Chemistry · 年份：1998 · DOI：10.1021/ac9806963 · 被引用次数：223 · 研究领域：Radioactive element chemistry and processing、Ion-surface interactions and analysis、Nuclear materials and radiation effects

Reproducible time-of-flight cluster static secondary ion mass spectra (ToF-SSIMS) were obtained for various standard calcium phosphate (CP) powders, which allowed for phase identification. X-ray diffraction was not able to detect signals from microscopic amounts of CP (∼15 mmol m(-)(2)). The phases studied were α-tricalcium phosphate [α-Ca(3)(PO(4))(2)], β-tricalcium phosphate [β-Ca(3)(PO(4))(2)], amorphous calcium phosphate [Ca(3)(PO(4))(2)·xH(2)O], octacalcium phosphate [Ca(8)H(2)(PO(4))(6)·H(2)O], brushite (CaHPO(4)·2H(2)O), and hydroxyapatite [Ca(10)(PO(4))(6)(OH)(2)]. The SIMS spectra were obtained via bombardment with (CsI)Cs(+) projectiles. X-ray photoelectron spectroscopy (XPS) core levels of the P 2p, Ca 2p, and O 1s orbitals and the relative O 1s loss intensity were examined. The PO(3)(-)/PO(2)(-) ratios from ToF-SSIMS spectra in conjunction with XPS of the CP powders showed much promise in differentiating between these phases at microscopic CP coverages on the metal oxide surface.