Scanning electron microscopic and x-ray photoelectron spectroscopic examination of Tokai glassy carbon surfaces subjected to radio frequency plasmas

作者：Charles William Miller, Dale H. Karweik, Theodore Kuwana · 发表于：Analytical Chemistry · 年份：1981 · DOI：10.1021/ac00237a043 · 被引用次数：88 · 研究领域：Diamond and Carbon-based Materials Research、Plasma Diagnostics and Applications、Laser-induced spectroscopy and plasma

ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTScanning electron microscopic and x-ray photoelectron spectroscopic examination of Tokai glassy carbon surfaces subjected to radio frequency plasmasCharles W. Miller, Dale H. Karweik, and Theodore. KuwanaCite this: Anal. Chem. 1981, 53, 14, 2319–2323Publication Date (Print):December 1, 1981Publication History Published online1 May 2002Published inissue 1 December 1981https://pubs.acs.org/doi/10.1021/ac00237a043https://doi.org/10.1021/ac00237a043research-articleACS PublicationsRequest reuse permissionsArticle Views216Altmetric-Citations63LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore...