Improving the microwave window breakdown threshold by using a fluorinated, periodically patterned surface

作者：C. H. Chen, Chao Chang, W. Y. Liu, Jun Sun, Huijun Huang, Chuang Ke, Wei Song, Yan Teng, Xiaolong Wu, Jinlong Xie, Meng Zhu, shengnan Li, Jinyong Fang, Ping Wu, L. J. Zhang · 发表于：Journal of Applied Physics · 年份：2013 · DOI：10.1063/1.4826627 · 被引用次数：37 · 研究领域：Gyrotron and Vacuum Electronics Research、Particle accelerators and beam dynamics、Plasma Diagnostics and Applications

The breakdown at the dielectric window of the high-power microwave (HPM) horn limits the maximum radiation power of HPM system, and keeps the bottle neck of the development of the HPM technology in decades. In this paper, the multi-way diagnostics for the window breakdown at vacuum/dielectric interface are studied in the C-band multi-gigawatt HPM experiment with the atmospheric pressure SF6 environment. The method of using the fluorinated periodic surface is demonstrated to significantly improve the power capacity by fourfold, compared with the flat surface. The threshold for fluorinated periodic surface could be higher than 70 kV/cm for HPM with the frequency 4.3 GHz, and 40 ns pulse width.