On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitations

作者：H. Sellier, Benoit Hackens, Marco G. Pala, Frederico Martins, Samuel E. Baltazar, Xavier Wallart, L. Desplanque, V. Bayot, S. Huant · 发表于：Semiconductor Science and Technology · 年份：2011 · DOI：10.1088/0268-1242/26/6/064008 · 被引用次数：91 · 研究领域：Advancements in Semiconductor Devices and Circuit Design、Quantum and electron transport phenomena、Semiconductor materials and devices

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