The detection of the periodic structure of high-angle twist boundaries

作者：S.L. Sass, T. Y. Tan, R. W. Balluffi · 发表于：Philosophical magazine · 年份：1975 · DOI：10.1080/14786437508226538 · 被引用次数：74 · 研究领域：Semiconductor materials and interfaces、Microstructure and mechanical properties、Surface and Thin Film Phenomena

An electron diffraction technique was developed to study the structure of high-angle grain boundaries. Diffraction patterns were obtained from the grain boundary region, and it was demonstrated for the first time that high-anglo ⟨001⟩ twist boundaries have a periodic nature over the entire range of possible misorientations. Relatively strong grain boundary reflections corresponding to reflections from the 0-lattice wore obtained from all boundaries studied. These results indicate that atomic relaxations occur around the 0-lattice points and those relaxations appear to be qualitatively similar to those which are well known to occur in low-angle twist boundaries.