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Problems of advanced micro- and nanoelectronic systems development
出版商：FSFIS Institute for Design Problems in Microelectronics RAS · ISSN：2078-7707 · 国家/地区：RU · 类型：journal · OA 开放获取
研究主题：Embedded Systems Design Techniques · VLSI and Analog Circuit Testing · VLSI and FPGA Design Techniques · Radiation Effects in Electronics · Advanced Data Processing Techniques
数据覆盖：3 个公开学术数据源交叉核验（crossref、openalex、wikidata）。
数据来源与实体核验
核心指标
- h-index:7
- i10 指数:5
- 载文量 443 · 总被引 499
- Crossref DOI 总量:442
常见问题
《Problems of advanced micro- and nanoelectronic systems development》是开放获取(OA)期刊吗?
是,《Problems of advanced micro- and nanoelectronic systems development》是开放获取(Open Access)期刊。