Zhiguo Wen
机构：Beijing Microelectronics Technology Institute
发表论文 2 篇 · 总被引 9 次 · h-index 1
代表论文
- Induced-Charge Assisted Faradaic Capacitive Deionization: A New Paradigm to Break the Capacity-Rate Trade-off (2026 · Environmental Science & Technology · 被引 10)
- High Precision MEMS Piezoresistive Pressure Sensor for SF6 Digital Density Meter in Power Grid System (2026)