Baiwei Chen
机构：China Electronic Product Reliability and Environmental Test Institute, Xiangtan University · ORCID：0009-0001-7755-5915
发表论文 3 篇 · 总被引 38 次 · h-index 2
代表论文
- Effects of 300-MeV Proton Irradiation on Electrical Properties of β -Ga 2 O 3 Schottky Barrier Diodes (2024 · IEEE Transactions on Electron Devices · 被引 22)
- Laser diode end-pumped Yb:YAG/LBO green laser (2009 · Laser Physics · 被引 16)
- The impact of defect evolution on the electrical performance of AlGaN/GaN HEMT after 14-MeV neutron irradiation (2025 · Applied Physics Letters)