S.C. Lee

机构：Taiwan Semiconductor Manufacturing Company (Taiwan)

发表论文 2 篇 · 总被引 11 次 · h-index 2

代表论文

• Real case study for isothermal EM test as a process control methodology (2002 · 被引 8)
• Isothermal wafer-level electromigration test for the characterization of metal system reliability monitoring (2002 · 被引 3)