Kain Lu Low

机构：University of Liverpool, Xi’an Jiaotong-Liverpool University · ORCID：0000-0002-3999-7261

发表论文 71 篇 · 总被引 910 次 · h-index 15

代表论文

• Transfer Learning-Based Artificial Intelligence-Integrated Physical Modeling to Enable Failure Analysis for 3 Nanometer and Smaller Silicon-Based CMOS Transistors (2021 · ACS Applied Nano Materials · 被引 46)
• TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis (2019 · 被引 44)
• High-Yield Enhancement-Mode GaN p -FET With Etching-Target Layer and High-Selectivity Etching Techniques (2024 · IEEE Transactions on Electron Devices · 被引 15)
• Significance of activation functions in developing an online classifier for semiconductor defect detection (2022 · Knowledge-Based Systems · 被引 15)
• Non-Intrusive Load Monitoring using Feed Forward Neural Network (2019 · 被引 14)
• Graph Attention Network-Based Unified TCAD Modeling Enabling Fast Design Technology Co-Optimization Through Transfer Learning (2024 · IEEE Transactions on Electron Devices · 被引 11)