Venkat Anil Adibhatla
机构：Zhen Ding Technology (Taiwan), Yuan Ze University · ORCID：0009-0003-6575-6773
发表论文 4 篇 · 总被引 327 次 · h-index 4
代表论文
- Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks (2020 · Electronics · 被引 174)
- Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once (2021 · Mathematical Biosciences & Engineering · 被引 101)
- Detecting Defects in PCB using Deep Learning via Convolution Neural Networks (2018 · 被引 33)
- Unsupervised Anomaly Detection in Printed Circuit Boards through Student–Teacher Feature Pyramid Matching (2021 · Electronics · 被引 19)