Chinte Kuo

机构：Fudan University, State Key Laboratory of ASIC and System

发表论文 4 篇 · 总被引 4 次 · h-index 1

代表论文

• Isothermal wafer-level electromigration test for the characterization of metal system reliability monitoring (2002 · 被引 3)
• Subtle gate oxide defect elimination to improve the reliability of a 32M-bit SRAM product (2015 · Materials Science in Semiconductor Processing · 被引 1)
• Application of resist-profile-aware source optimization in 28 nm full chip optical proximity correction (2017 · Journal of Semiconductors)
• Efficient defect identification of soft failures induced by device local mismatch for nano-scale SRAM yield improvement (2016 · Materials Science in Semiconductor Processing)